基于TDDB的數(shù)字隔離器壽命測試系統(tǒng)

摘" 要： 為評估數(shù)字隔離器在長期使用過程中的穩(wěn)定性和壽命，提出一種基于經(jīng)時擊穿（TDDB）的壽命測試系統(tǒng)，通過自動化和多路并行測試來提升測試效率。具體方法包括設(shè)計一個支持16路同時進(jìn)行測試的系統(tǒng)，使用DSP控制程序和上位機(jī)軟件進(jìn)行數(shù)據(jù)處理，并通過增加電壓應(yīng)力來加速老化測試。實驗結(jié)果表明：該系統(tǒng)能夠在檢測到失效時立即終止測試，并自動記錄失效時間；同時通過模擬工作電壓環(huán)境，提高了測試結(jié)果的可靠性。與傳統(tǒng)方法相比，所設(shè)計系統(tǒng)顯著減少了人工干預(yù)，提高了測試效率和可靠性，并且能夠提前預(yù)警潛在故障，為電氣系統(tǒng)的穩(wěn)定運行提供了有力保障。該研究對于提高數(shù)字隔離器的可靠性和壽命，以及保障電氣系統(tǒng)的安全運行具有一定的理論和實踐意義。

關(guān)鍵詞： 數(shù)字隔離器； 經(jīng)時擊穿； 壽命測試； 可靠性評估； 柵氧化層擊穿； 回路電流監(jiān)測

中圖分類號： TN761?34" " " " " " " " " " " " " " " 文獻(xiàn)標(biāo)識碼： A" " " " " " " " " " "文章編號： 1004?373X（2025）06?0039?06

TDDB?based lifespan testing system for digital isolators

LI Ziteng1， WANG Jinjun1， CHEN Xuanyu2， WANG Kai1

（1. School of Electronic Information and Artificial Intelligence， Shaanxi University of Science amp; Technology， Xi’an 710021， China;

2. Xi’an Xiangteng Microelectronics Technology Co.， Ltd.， Xi’an 710068， China）

Abstract： In order to evaluate the stability and longevity of digital isolators during long?term usage， a lifespan testing system based on time?dependent dielectric breakdown （TDDB） is proposed， which can enhance testing efficiency by means of automation and multi?channel parallel testing. The specific method includes designing a 16?channel testing system， using DSP control program and PC software for data processing， and accelerating the aging test by increasing the voltage stress. The experimental results show that this system can immediately terminate the test and automatically record the failure time upon detecting a failure， while improving the reliability of testing results by simulating working voltage environments. In comparison with traditional methods， the designed system can significantly reduce manual intervention， enhance testing efficiency and reliability， and can preemptively warn of potential failures， providing strong assurance for the stable operation of electrical systems. This research has a certain theoretical and practical significance for improving the reliability and lifespan of digital isolators and ensuring the safe operation of electrical systems.

Keywords： digital isolator; time?dependent dielectric breakdown; lifespan testing; reliability assessment; gate oxide layer breakdown; loop current monitoring

0" 引" 言

數(shù)字隔離器在電氣系統(tǒng)中扮演著關(guān)鍵角色，用于隔離系統(tǒng)中不同元件間的數(shù)字信號或開關(guān)量信號，具有體積小、成本低及外圍電路簡單等優(yōu)點，廣泛應(yīng)用于家用電器、醫(yī)療設(shè)備和工業(yè)控制系統(tǒng)等領(lǐng)域[1]。這些應(yīng)用領(lǐng)域?qū)?shù)字隔離器的可靠性要求極高，任何故障都可能導(dǎo)致系統(tǒng)崩潰或安全事故。

數(shù)字隔離器實現(xiàn)隔離的方式主要有電磁、電容和光耦合。光耦合隔離器由輸入LED、接收光電探測器和輸出驅(qū)動組成，但由于其存在低速、傳輸單向性和不易集成等缺點，逐漸被與CMOS工藝兼容的電磁和電容耦合方案所取代[2]。……